CC-TLP（Wafer Level CDM）

产品概要：

• Capacitively coupled TLP probearm (CC-TLP)

• Compatible with standard probing stations

• 18 GHz SMA connector

• Tilt angle adjustment

• Calibration gauge for needle height

• MPI RF probe arm PA-R-E (PROBE ARM RF EAST / STD)

基本信息：

The CC-TLP-50-A1 probearm is used for CC-TLP measurements in order to investigate the CDM performance of the device under test [1], [2], [3], [4], [5]. For that purposethe TLP pulse has to have a pulse width less than 1 ns and a rise time of about typical 100 ps.DUT voltage and current have to be measured using a vf-TLP setup.Fig. 1 shows the comparison of a typical CC-TLP waveform generated with a 1 ns long pulse and CDM.

References [1] H. Gieser, “Method and device for charging integrated circuits and structures with a pulsed heavy current,” US6512362B1. [2] H. Wolf, H. Gieser, W. Stadler, and W. Wilkening, “Capacitively coupled transmission line pulsing cc-tlp, a traceable and reproducible stress method in the cdm-domain,” in Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD ’03., Sep. 2003, pp. 1–8. [3] H. Wolf, H. Gieser, K. Bock, A. Jahanzeb, C. Duvvury, and Y. Y. Lin, “Capacitive coupled tlp (cctlp) and the correlation with the cdm,” in EOS/ESD Symposium, 2009 31st, Jul. 2009, pp. 1–8. [4] K. Esmark, R. Gaertner, S. Seidl, F. zur Nieden, H. Wolf, and H. Gieser, “Using cc-tlp to get a cdm robustness value,” in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Sep. 2015, pp. 1–10. DOI: 10 . 1109 / EOSESD.2015.7314799. [5] H. Gieser, H. Wolf, and F. Iberl, “Comparing arcfree capacitive coupled transmission line pulsing cc-tlp with standard cdm testing and cdm field failures,” in ESD-Forum, Berlin, 2005, pp. 11–18.

技术优势：

1.实现Wafer level的CDM测试

2.以VF-TLP为源

3.灵活探针台搭配

应用方向：

先进的TLP/HMM/HBM解决方案。

CC-TLP（Wafer Level CDM）

CC-TLP（Wafer Level CDM）

CC-TLP（Wafer Level CDM）

CC-TLP（Wafer Level CDM）